본문 바로가기 대메뉴 바로가기
open
Close

Functional Oxide Nanostructure Lab.

Research

Time resolved X-ray microdiffraction

Time resolved X-ray microdiffration

sub020102_img01

Lots of electronic devices such as computer memories require the operation at the high frequencies. There have been high demands to understand / develop the ultrafast behaviors of order parameters such as spin, charge, strain, conductivity to be used as information at timescale of nanosecond or shorter.

Recent advances in complex oxide thin film synthesis and in first principles calculations have intensified the basic research on functionalities at nanoscale dimensions. Many workers have reported intriguing dynamics phenomena occurring in ultrathin films, such as nanosecond relaxation of polarization, switching dynamics, and fast recovery to stripe domain patterns. On the other hand, the mechanism and dynamics in ultrathin films have rarely been investigated in spite of their scientific and technological importance.

We study the dynamics of piezoelectric/ferroelectric/multiferroic materials using our unique technique, i.e., time-resolved x-ray diffraction microscopy, which provides great opportunities us to study the crystallographic structures strongly correlated to the strain, polarization, and spin orders. We aim to find a new material for the ultrafast devices.

QUICK
MENU
GIST 대표GIST 대표 GIST PortalGIST Portal 신소재공학부신소재공학부 도서관도서관